Semiconductor Product Lifetime prediction
As semiconductor products sold to markets, customers or users would like to understand in case it occurs RMA incident, what the quantity of material shall be prepared except for the satisfaction of product in markets. This issue affects not only after-sales service and customer satisfaction, but also the cost of material preparation. Therefore, an effective and accurate life estimation will help logistic support services between buyers and sellers. As for the reliability experimental factors, temperature, humidity, voltage, and current are the most commonly used parameter types. The extended life estimation factor is also closely related to these parameters. The commonly used categories are as follows:
AF，Accelerated Factor
Acceleration factor (AF) enables to shorten the test time and obtain equivalent or similar benefits through appropriate tightened experimental conditions such as increasing temperature and humidity measures. It shall be noted that the range of conditions for the designs of the acceleration factor and consider the material withstand level of the tested product in order to avoid distortion of the results owing to conditions exceeding the level of the tested object and resulting in misjudgment and invalid experiments.
Arrhenius’ Equation
Arrhenius equation is the most important equation in reaction kinetics and an important law in the theory of physics and chemistry. The Arrhenius equation is commonly applied in the life prediction of various electronic products. Its principle is in accordance with the fact that the collision reaction of the substance itself increases at higher temperature, and the reaction rate is an index generated by the activation energy and temperature difference of the material method estimation, and then the acceleration factor value is estimated. The following equations are the recommended calculation formulas in AEC-Q100:
Coffin-Manson Model:
Arrhenius equation is the most important equation in reaction kinetics and an important law in the theory of physics and chemistry. The Arrhenius equation is commonly applied in the life prediction of various electronic products. Its principle is in accordance with the fact that the collision reaction of the substance itself increases at higher temperature, and the reaction rate is an index generated by the activation energy and temperature difference of the material method estimation, and then the acceleration factor value is estimated. The following equations are the recommended calculation formulas in AEC-Q100:
Hallberg-Peck Model:
Under a general environment, temperature and humidity coexist. Many electronic products are prone to occur corrosion and ionization in the environment of warmth and humidity. In the development trend of thinner and smaller electronic products, the circuit design is continuously reducing. Under the same voltage difference, the problem of metal ion migration is more likely to occur.
FIT (Failure In Time) and MTTF (Mean Time To Failure):
FIT is a common indicator of failure rate. Its definition refers to the number of failures that may occur at 109 product-hours (for example, one thousand parts run for one million hours, ten thousand parts run for one hundred thousand hours, etc.), and are commonly used in the semiconductor industry as the quality of life reference. FIT related to MTIT, the mean time to failure, is the reciprocal relation of FIT that can estimate the failure rate in a specific interval after shipment and estimate the stock preparation after shipment.
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