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Automotive Electronic Reliability Test

Automotive electronic reliability test 

       The Automotive Electronics Council (AEC) has developed different verification standards according to product categories and proper validation basis in order to provide a common reference verification standard for the verification of electronic components.

In the relevant regulations of AEC, it is clearly defined that there is no certification mechanism and emphasizes a self-declaration and a contract between the buyer and the seller. It also enhances the concept of the product family and focuses on the requirements of process quality control (SPC) that is more rigorous than the traditional consumer product market with JEDEC.

AEC verification classification

  • AEC-Q:AEC-Q series verification classification: The main verification is classified as follows, its  distinguished according to the part group category. AEC-Q103 is a new test application for MEMS related products published in 2019 and makes the overall application more complete.

 

  • Product temperature resistance gradeProduct temperature resistance is divided into four grades according to the position of the part in the vehicle. The difference from the traditional JEDEC 47 is that AEC is defined as the test ambient temperature Ta, but not Tj, so it’s strict and makes manufacturers that want to implement verification with difficulties and thresholds.

Grade

Ambient Operation Temperature Range

0

-40°C to +150°C

1

-40°C to +125°C

2

-40°C to +105°C

3

-40°C to +85°C

Comparison of AEC-Q series and JEDEC 47     

Description

JEDEC 47

AEC Q100

Test items

Follow test items

Self-development and experiment

Test sample size

Less

More

Test duration / cycles

Shorter

Longer( estimated based on life cycle)

Temperature

Adopt product Tj

Adopt Environment Ta

Data collection

For acknowledgment

Start from product development

Family application

Defined

Defined covers the scope

Engineering change

Clear definition

Clear definition

Life prediction

Easy to description

Accurate calculation method

SPC calculation

Less

Application

Pb-Free consideration

Less

Cover verification

standard

DPA process

No

Cover verification standard

Criteria

Easier

Clear acceptance standard

VESP AEC Verification Capability

      VESP Technology Corp. focuses on semiconductor product verification, integrating FIB, failure analysis, ESD static testing, hardware design services, reliability testing to form a complete service network to assist customers quickly access the automotive electronics market.  


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