semiconductor verification

Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM) & EDS

The surface of the sample is scanned by electron beam with Scanning Electron Microscopy (SEM) & EDS. As the electron beam is accelerated, it will stimulate secondary electron, backscattered electron, and characteristic X-ray to be imaging with collecting secondary electron or backscattered electron. X-ray can be used for component analysis.

Application Scenario

  • Observe the sample surface.
  • VC (Voltage contrast), find anomalies with light and dark contrast
  •  EDS for qualitative and semi-quantitative component analysis

​Equipment Capacity

Case Study

Customer Service

TEL:03-6669700 ext. 6272,6274

Consulting mailbox
Hello, if you have any questions or suggestions for us, please call + 886-3-666-9700 # 9 or leave a message on the form below and we will reply you as soon as possible, thank you!
* Company
* Phone
Consulting item (multiple-choice)