Scanning Electron Microscope (SEM) & EDS
The surface of the sample is scanned by electron beam with Scanning Electron Microscopy (SEM) & EDS. As the electron beam is accelerated, it will stimulate secondary electron, backscattered electron, and characteristic X-ray to be imaging with collecting secondary electron or backscattered electron. X-ray can be used for component analysis.
- Observe the sample surface.
- VC (Voltage contrast), find anomalies with light and dark contrast
- EDS for qualitative and semi-quantitative component analysis
TEL：03-6669700 ext. 6272,6274