VESP provides complete semiconductor reliability testing projects, one-stop services such as integration consulting, experimental design planning, hardware design and manufacturing, reliability testing, life estimation, etc., to assist customers certified by JEDEC, MIL-STD, AEC and other reliability international Standard.

• IC Operating Life Test(OLT)

• Environmental Stress Test

• Automotive Electronic Reliability Test

• Reliability Hardware Design Services

• Product Lifetime Prediction

VESP provides the industry's most advanced ESD / LU test equipment to assist customers in conducting electrostatic protection testing of various types of packages.

• Latch Up

• TLP

• ESD(HBM,MM,CDM)

VESP provides experimental equipment and engineering technical support services for EFA and PFA, diagnose the problem and find out what cause of failure.

• SAT
• X-ray

• InGaAs
• OBIRCH
• Thermal EMMI

• Laser/Decap
• Delayer
• Cross-Section
• Cross Section Polisher (CP)
• Scanning Electron Microscope (SEM)

VESP provides dynamic failure analysis solutions to help customers find traditional failures Effective analysis methods, hidden problems that could not be found and thoroughly debugged.

• Dynamic EMMI

• DALS

• EOP/EOPM

IC circuit edit is a fast and effective tool for verifying the effectiveness of revision masks. New chip design can be applied to defect, debug, and verify revisions. Component characteristic experiments and failure analysis are the services provided by circuit edit.

• Al Process Edit

• Cu Process Edit