semiconductor verification



  X-ray inspection generates X-ray through ionizing radiation. When X-ray passes through the object, it will occur absorption, scattering, and penetration. Therefore, different intensity contrast is generated on the detector for image analysis which can detect welding defects of packaging and non-destructive inspection to various samples. VESP Technology Corp provides X-ray inspection services with 2D and 3D functions. The overall operation time is short and the find out failure point effectively.


  • Welding defect
  • packaging  defects
  • non-destructive inspection to various samples

​Equipment Capacity

Case Study

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TEL:03-6669700 ext. 6272,6274

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